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Defects in microelectronic materials and devices

ENGnetBASE
Author Fleetwood, Daniel
ISBN/ISSN 9781420043761
Broad Subject Electrical & electronic engineering
General - Engineering & Technology
Subject Microelectronics - Materials - Testing
Metal oxide semiconductor field-effect transistors - Testing
Integrated circuits - Defects
Publisher CRC Press
Language English
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Format Handbooks, manuals
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Location Web Mounted
   
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